Upgrade of a commercial four-probe scanning tunneling microscopy system.

نویسندگان

  • Ruisong Ma
  • Qing Huan
  • Liangmei Wu
  • Jiahao Yan
  • Qiang Zou
  • Aiwei Wang
  • Christian A Bobisch
  • Lihong Bao
  • Hong-Jun Gao
چکیده

Upgrade of a commercial ultra-high vacuum four-probe scanning tunneling microscopy system for atomic resolution capability and thermal stability is reported. To improve the mechanical and thermal performance of the system, we introduced extra vibration isolation, magnetic damping, and double thermal shielding, and we redesigned the scanning structure and thermal links. The success of the upgrade is characterized by its atomically resolved imaging, steady cooling down cycles with high efficiency, and standard transport measurement capability. Our design may provide a feasible way for the upgrade of similar commercial systems.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Scanning hall probe microscopy technique for investigation of magnetic properties

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

متن کامل

Scanning hall probe microscopy technique for investigation of magnetic properties

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

متن کامل

An overview of scanning near-field optical microscopy in characterization of nano-materials

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...

متن کامل

An overview of scanning near-field optical microscopy in characterization of nano-materials

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...

متن کامل

Characterization of semiconductor surface conductivity by using microscopic four-point probe technique

Four-point probe characterization is a standard method for studying the electrical properties of solids and thin films. The probe spacing in four-point probe technique has to be reduced to micro-scale to obtain expected surface sensitivity and spatial resolution. Therefore, microscopic four-point probes (M4PPs) need to be combined with some microscopy techniques. Two types of M4PPs systems have...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • The Review of scientific instruments

دوره 88 6  شماره 

صفحات  -

تاریخ انتشار 2017